Instruments: MTGSERDES

Description In order to help designers and test engineers validating their parts, the MTGSERDES has many features enabling them to understand their design strength: on the transmit side, the output swing, common mode, pre-emphasis value and duration are programmable; on the receive side, the instrument equalization value is programmable. In addition, after input equalization, the receiver CDR can be unlocked in order to shift the strobe position from its ideal position and evaluate the receive window. The instrument has several mode of operation:
In DUT loop-back mode, the instrument sends a pattern and tries to get it back from the DUT;
In instrument loop-back the DUT receives what it sends;
For quick setup and fast throughput, the embedded pattern generator works in standalone and generates PRBS under SATA, PCIe, AUXi, and many other serial protocols.
In case the user needs to control every single bit, the pattern memory allows setting any bit stream being send on the link.
Trigger input and versatile synchronization bus allows for timing alignment with external instruments as well as integration of the MT 800 SERDES in complex test setup.
The instrument uses its internal clock reference or can be feed with and external clock for isochronous setup.

Key Features • Up to four 6.4Gbps SERDES channels
• Versatile transmitter
DC coupled - 50 ohms source terminated
DC offset control
Programmable swing
Programmable Pre emphasis (magnitude and duration)
• Versatile receiver
Programmable equalization,
Programmable strobe position vs ideal
• On the fly disable and shutdown mode for OOB signaling
• Pre defined pattern for quick setup,
• Or protocol driven pattern,
• Or fully programmable bit stream
• 128 Mbit per lane to up 4Gbit per option
• DUT loop back mode,
• Instrument loop back mode
• Compare versus send, Compare versus expected or capture data.
• Support for many protocol as PCIe (4 lanes), SATA, XAUI, RapidIO, …
• Synchronization bus for instrument time alignment and integration in complex test setup
• Internal programmable clock with fine resolution
• or external reference clock.

Applications • Automatic Test Equipment
• Device characterization
• Telecommunications
• Test and measurement
• Serial link verification (SATA, PCIe, ..)