Instruments: MTD864

Description Designed for SOC and Memory testing, the MTD864 supports many mode of operations and data distribution:
- Up to 1Gbit chain can be applied on any pin, allowing scan testing of complex devices,
- Source synchronous testing mode allows for accurate strobing of memory controllers or devices,
- Hardware Subroutine and APG allows for complex pattern generation,

Debug of your device is facilitated with the optional CBitmap module which implements either 32Mbit of capture memory or a true Bitmap providing you with the failing memory cells
The 1Gbps dual Driver Comparator Load interfaces with any single ended or differential technology. Fast and accurate parametric test and characterization are performed through the embedded PmuPP.

Its FPGA based technology insures you a ROI on multiple DUT generation as well as implementation of proprietary protocol or access.

Key Features • 32 differential or 64 single ended, or any combination
• 200 MHz complex instruction set sequencer
• Independent timing generator per channel
• Multi source data provider:
   800Mbps on 64 channels
   Subroutine memory
   Scan support
   Pattern chaining and looping
   32 MVector per channel (Optional 256 MVec).
• Flexible IO:
   Independent level per channel
   3 level driver (High, Low, Vterm and High Z)
   High Voltage level per channel for Vpp
   Per Pin PMU
• Memory support
   APG
   Source synchronous strobe mode
   HW bitmap as an option
• Synchronized with additional modules or instrument for:
   High pin count device and parallel testing (up to 4096 channels)
   Device Power Supply with MTDPS10 module
   High speed clock generation with Serdes module
• Total Power < 120W, air cooled.

Applications • Automatic Test Equipment
• Test and measurement
• Device characterization and validation