All digital circuits (either full circuits, or IP blocks), especially with datarates and speed above 50/100/200 Megabits per second, and / or requiring large tester memories (pattern & capture), for which Mu-TEST platform capabilities are ideally suited.
Thanks to its mixed signal instrument, Mu-TEST platform can also manage testing of Systems on Chip (SoC) devices.
With dedicated capture instruments, Mu-TEST is perfectly positionned to adress IC devices with arrays or matrixes, such as image sensors, and memories.